IRIS (Infra-Red, in situ) is a technique for non-destructively inspecting the construction of a select but common type of chip. It can improve visibility into our hardware and provide supporting evidence of its correct construction, without desoldering chips or expensive analytical gear. This talk covers the theory behind IRIS, as well as some embodiments of the technique. I will also frame the relevance of IRIS in the face of various threat scenarios. Time permitting, I’ll also show how you can do it at home by peeking around a few chips as a demo.